Material | Measured μ (cm−1) | % deviation from theoretical (including Coherent scatter) | % deviation from theoretical (excluding Coherent scatter) |
---|---|---|---|
Samples A and D (140 keV) | 28.1 ± 0.3 | 22–23% | 17–19% |
Sample E (140 keV) | 22.7 ± 0.4 | 36–38% | 33–35% |
Samples A and D (364 keV) | 3.7 ± 0.1 | 12–17% | 5–10% |
Sample E (364 keV) | 3.1 ± 0.2 | 24–33% | 18–28% |