Table 1 Details of SPECT/CT systems and reconstruction software used in the comparison exercise. TEW, triple-energy window; ESSE, effective scatter source estimation [18, 19]
Setup ID | Manufacturer | Model | CT slices | Crystal thickness | Reconstruction software | Scatter correction | Resolution recovery |
|---|---|---|---|---|---|---|---|
S1 | Siemens | Symbia T2 | 2 | 9.5 mm | Siemens e.soft | TEW | Yes |
S2a | GE Healthcare | Discovery 670 | 16 | 9.5 mm | GE Xeleris | TEW | Yes |
S2b | GE Healthcare | Discovery 670 | 16 | 9.5 mm | Hermes | TEW | Yes |
S2c | GE Healthcare | Discovery 670 | 16 | 9.5 mm | Hermes | Monte Carlo | Yes |
S3 | GE Healthcare | Discovery 670 | 16 | 15.9 mm | In-House | ESSE | Yes |
S4 | Mediso | AnyScan SCP | 16 | 9.5 mm | Nucline | TEW | No |
S5 | GE Healthcare | Discovery 670 | 16 | 9.5 mm | GE Xeleris | TEW | Yes |
S6 | GE Healthcare | Optima NM/CT 640 | 4 | 9.5 mm | GE Xeleris | TEW | Yes |
S7 | GE Healthcare | Optima NM/CT 640 | 4 | 9.5 mm | GE Xeleris | TEW | Yes |
S8 | Siemens | Symbia Intevo Bold | 16 | 9.5 mm | Siemens e.soft | TEW | Yes |
S9 | Siemens | Symbia T2 | 2 | 15.9 mm | Siemens e.soft | TEW | Yes |