Fig. 6

Simulated data: a–c estimated \(FHWM_{xyz}\) for 10 to 1000 MLEM iterations for \(h_{pts}\), \(h_{PVC}\) and \(h_{AFC}\) for each of the six VOIs, simulated on a GE D710 scanner in SIRF; d–f RMSE of the AF-corrected reconstructed VOIs at 10–1000 MLEM iterations; the mu-map was smoothed by the optimal kernel for each VOI determined for \(h_{pts}\), \(h_{PVC}\) and \(h_{AFC}\), respectively. Each marker shape represents a VOI density (mean and 1\(\sigma\))