Fig. 6From: Cherenkov luminescence measurements with digital silicon photomultipliers: a feasibility studyData processing flow. Procedure for dark count maps (left), and for source count maps (right). Acronyms, DCM dark count map, SCM source count map, p percentage of inhibition (fraction of HDC cells discarded), DCR dark count rate, SCR source count rate, T average die temperatureBack to article page